Atsushi Tokuhisa, Junichiro Taka, Hidetoshi Kono, Nobuhiro Go
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引用次数: 0
摘要
我们开发了一种新的两步算法,用于从许多实验测量的量子噪声限制的二维 X 射线激光衍射图样中重建球状生物大分子的三维衍射强度。第一步是根据相对于分子的入射 X 射线方向的相似性将二维衍射图样分为若干组,并对每组进行平均以减少噪声。第二步是检测信号增强的二维图案之间的共同相交圆,以确定它们在三维波数空间中的相互位置。新开发的算法能在每个有效像素低至 ~0.1 光子的高噪声光子计数实验数据中检测出用于分类的信号。这种极限像素的波长决定了可达到的结构分辨率。从这一事实出发,可以得出这种新分析方法所能达到的量子噪声导致的分辨率极限,以及两个重要的实验参数,即需要测量的二维图案数量(探测器的负载)和需要分析的二维图案对数量(计算机的负载),它们是入射 X 射线强度和目标分子特征量的函数。
Classifying and assembling two-dimensional X-ray laser diffraction patterns of a single particle to reconstruct the three-dimensional diffraction intensity function: resolution limit due to the quantum noise.
A new two-step algorithm is developed for reconstructing the three-dimensional diffraction intensity of a globular biological macromolecule from many experimentally measured quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The first step is classification of the two-dimensional patterns into groups according to the similarity of direction of the incident X-rays with respect to the molecule and an averaging within each group to reduce the noise. The second step is detection of common intersecting circles between the signal-enhanced two-dimensional patterns to identify their mutual location in the three-dimensional wavenumber space. The newly developed algorithm enables one to detect a signal for classification in noisy experimental photon-count data with as low as ~0.1 photons per effective pixel. The wavenumber of such a limiting pixel determines the attainable structural resolution. From this fact, the resolution limit due to the quantum noise attainable by this new method of analysis as well as two important experimental parameters, the number of two-dimensional patterns to be measured (the load for the detector) and the number of pairs of two-dimensional patterns to be analysed (the load for the computer), are derived as a function of the incident X-ray intensity and quantities characterizing the target molecule.
期刊介绍:
Acta Crystallographica Section A: Foundations and Advances publishes articles reporting advances in the theory and practice of all areas of crystallography in the broadest sense. As well as traditional crystallography, this includes nanocrystals, metacrystals, amorphous materials, quasicrystals, synchrotron and XFEL studies, coherent scattering, diffraction imaging, time-resolved studies and the structure of strain and defects in materials.
The journal has two parts, a rapid-publication Advances section and the traditional Foundations section. Articles for the Advances section are of particularly high value and impact. They receive expedited treatment and may be highlighted by an accompanying scientific commentary article and a press release. Further details are given in the November 2013 Editorial.
The central themes of the journal are, on the one hand, experimental and theoretical studies of the properties and arrangements of atoms, ions and molecules in condensed matter, periodic, quasiperiodic or amorphous, ideal or real, and, on the other, the theoretical and experimental aspects of the various methods to determine these properties and arrangements.