环境条件下CH3NH3PbI3杂化钙钛矿薄膜结构稳定性研究

IF 0.4 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-06-25 DOI:10.1134/S102745102570003X

T. Yu. Zelenyak, A. S. Doroshkevich, V. V. Kriger, T. N. Vershinina, T. V. Tropin, M. V. Avdeev

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引用次数: 0

摘要

杂化有机-无机钙钛矿材料作为一种很有前途的光收集材料在光伏发电领域备受关注。然而，其工业实施的主要问题是在各种温度和湿度条件下的稳定性。利用x射线衍射研究了杂化钙钛矿薄膜在环境条件下晶体结构的变化。特别是，在膜的降解过程中，检测到一水合物作为中间相的形成。此外，x射线衍射数据显示了薄膜的逐层降解。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Study of Structural Stability of Thin Films of CH3NH3PbI3 Hybrid Perovskite under Ambient Conditions

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Study of Structural Stability of Thin Films of CH3NH3PbI3 Hybrid Perovskite under Ambient Conditions

Hybrid organic-inorganic perovskite materials are of current interest as promising light-harvesting materials for photovoltaics. However, the main problem of their industrial implementation is the stability in various temperature and humidity conditions. The change in the crystal structure of hybrid perovskite thin films under ambient conditions was studied using X-ray diffraction. In particular, during degradation of the films, the formation of a monohydrate as an intermediate phase was detected. In addition, X-ray diffraction data indicated layer-by-layer degradation of the films.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.