微波吸波材料质量标准的探讨。板牙。14/2025)

IF 5.3 2区材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY

Advanced Electronic Materials Pub Date : 2025-09-04 DOI:10.1002/aelm.70084

Shengyu Yang, Peng Wu, Yanfei Sheng, Yiwen Dong, Zhiwei Li, Tao Wang, Liang Qiao, Fashen Li

{"title":"微波吸波材料质量标准的探讨。板牙。14/2025)","authors":"Shengyu Yang, Peng Wu, Yanfei Sheng, Yiwen Dong, Zhiwei Li, Tao Wang, Liang Qiao, Fashen Li","doi":"10.1002/aelm.70084","DOIUrl":null,"url":null,"abstract":"<p><b>Microwave Absorbing Materials</b></p><p>In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.\n\n <figure>\n <div><picture>\n <source></source></picture><p></p>\n </div>\n </figure></p>","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"11 14","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2025-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.70084","citationCount":"0","resultStr":"{\"title\":\"On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)\",\"authors\":\"Shengyu Yang, Peng Wu, Yanfei Sheng, Yiwen Dong, Zhiwei Li, Tao Wang, Liang Qiao, Fashen Li\",\"doi\":\"10.1002/aelm.70084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><b>Microwave Absorbing Materials</b></p><p>In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.\\n\\n <figure>\\n <div><picture>\\n <source></source></picture><p></p>\\n </div>\\n </figure></p>\",\"PeriodicalId\":110,\"journal\":{\"name\":\"Advanced Electronic Materials\",\"volume\":\"11 14\",\"pages\":\"\"},\"PeriodicalIF\":5.3000,\"publicationDate\":\"2025-09-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.70084\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Electronic Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://advanced.onlinelibrary.wiley.com/doi/10.1002/aelm.70084\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://advanced.onlinelibrary.wiley.com/doi/10.1002/aelm.70084","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}

引用次数: 0

摘要

微波吸收材料在这张封面图中，主要焦点是电磁波吸收器件层上的原子层，说明了工作的核心概念：建立吸收材料和吸收器件之间的关系。当电磁波入射到材料上时，器件层反映了三种不同的匹配机制——完全匹配、部分匹配和不匹配——这与第10.1002/aelm篇的讨论密切相关。202500239，乔亮，李发申等。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)

查看原文本刊更多论文

On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)

Microwave Absorbing Materials

In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.

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来源期刊

Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY

CiteScore

11.00

自引率

3.20%

发文量

433

期刊介绍： Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.