{"title":"CMOS图像传感器的RGB灵敏度和串扰预测","authors":"JangHyeon Lee;ByoungGyu Kim;Yongkeun Lee","doi":"10.1109/LED.2025.3562529","DOIUrl":null,"url":null,"abstract":"The CMOS image sensor (CIS) underpins optical applications, enabling high-resolution imaging across the visible and near-infrared spectra. Advances in nanofabrication have enhanced pixel density, improving resolution, but as pixel dimensions approach the diffraction limit, maintaining optical sensitivity without performance trade-offs remains challenging. Nanophotonic solutions, like nanophotonic-based color routers, address these limitations. This study builds on MetaRGB-Net, a machine learning framework achieving 98% prediction accuracy in optimizing RGB sensitivity. We introduce MetaRGBX-Net, which employs separate neural networks to optimize both RGB sensitivity and cross-talk, achieving 95% and 98% prediction accuracy, respectively. This enables precise optimization of critical parameters and serves as a foundation for Bayesian optimization to refine metasurface designs, ensuring efficient light routing through RGB channels while minimizing cross-talk. MetaRGBX-Net streamlines metasurface design and provides a scalable foundation for next-generation CIS applications in IoT, biomedical imaging, and environmental monitoring.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 7","pages":"1235-1238"},"PeriodicalIF":4.1000,"publicationDate":"2025-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10970058","citationCount":"0","resultStr":"{\"title\":\"MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor\",\"authors\":\"JangHyeon Lee;ByoungGyu Kim;Yongkeun Lee\",\"doi\":\"10.1109/LED.2025.3562529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The CMOS image sensor (CIS) underpins optical applications, enabling high-resolution imaging across the visible and near-infrared spectra. Advances in nanofabrication have enhanced pixel density, improving resolution, but as pixel dimensions approach the diffraction limit, maintaining optical sensitivity without performance trade-offs remains challenging. Nanophotonic solutions, like nanophotonic-based color routers, address these limitations. This study builds on MetaRGB-Net, a machine learning framework achieving 98% prediction accuracy in optimizing RGB sensitivity. We introduce MetaRGBX-Net, which employs separate neural networks to optimize both RGB sensitivity and cross-talk, achieving 95% and 98% prediction accuracy, respectively. This enables precise optimization of critical parameters and serves as a foundation for Bayesian optimization to refine metasurface designs, ensuring efficient light routing through RGB channels while minimizing cross-talk. MetaRGBX-Net streamlines metasurface design and provides a scalable foundation for next-generation CIS applications in IoT, biomedical imaging, and environmental monitoring.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 7\",\"pages\":\"1235-1238\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2025-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10970058\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10970058/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10970058/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
MetaRGBX-Net: RGB Sensitivity and Cross-Talk Prediction in CMOS Image Sensor
The CMOS image sensor (CIS) underpins optical applications, enabling high-resolution imaging across the visible and near-infrared spectra. Advances in nanofabrication have enhanced pixel density, improving resolution, but as pixel dimensions approach the diffraction limit, maintaining optical sensitivity without performance trade-offs remains challenging. Nanophotonic solutions, like nanophotonic-based color routers, address these limitations. This study builds on MetaRGB-Net, a machine learning framework achieving 98% prediction accuracy in optimizing RGB sensitivity. We introduce MetaRGBX-Net, which employs separate neural networks to optimize both RGB sensitivity and cross-talk, achieving 95% and 98% prediction accuracy, respectively. This enables precise optimization of critical parameters and serves as a foundation for Bayesian optimization to refine metasurface designs, ensuring efficient light routing through RGB channels while minimizing cross-talk. MetaRGBX-Net streamlines metasurface design and provides a scalable foundation for next-generation CIS applications in IoT, biomedical imaging, and environmental monitoring.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.