电磁场测量的EMC/EMI合规性:概述

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
MAPAN Pub Date : 2025-01-11 DOI:10.1007/s12647-024-00793-8
Abhinav Mishra, Satya Kesh Dubey
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引用次数: 0

摘要

人工智能和物联网的发展将短程连接提升到一个新的水平,为人类的生活带来了便利。它通过蓝牙或WiFi连接了每个家庭使用的电器、电子产品和可穿戴设备,并通过语音命令或基于应用程序的系统控制它们。这一进步使复杂的射频共存、干扰和暴露评估成为必要的评估。根据电磁兼容标准的辐射发射和磁化率要求,综述了现有的电磁兼容性和电磁干扰评估方法。在此方向上,综述了跨开区测试场、消声室、横向电磁室、紧凑天线测试范围、混响室和近场扫描技术的电磁场测量方法。每一种电磁场测量技术都被证明是应用驱动的,在许多科学方面都是有益的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

EMC/EMI Compliance for Electromagnetic Field Measurement: An Overview

EMC/EMI Compliance for Electromagnetic Field Measurement: An Overview

Advancement in artificial intelligence and internet of things has driven short-range connectivity to a different level which eases human life. This has connected each and every house use appliances, electronic gadgets, and wearable devices via Bluetooth or WiFi and facility to control them via voice command or app-based systems. This advancement leads to a complex RF coexistence, interference, and exposure assessment to an essential evaluation. This paper reviews the existing electromagnetic compatibility (EMC) and electromagnetic interference assessment methods as per EMC standards for radiation emission and susceptibility requirements. In this direction, EM field measurement methods are reviewed spanning-open area test site, anechoic chamber, transverse electromagnetic cell, compact antenna test range, reverberation chamber, and near field scanning techniques. Each technique for EM field measurement proves to be application-driven and beneficial in many scientific aspects.

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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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