从原子探针断层扫描数据计算界面过量的不确定性。

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Levi Tegg, Julie M Cairney
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摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
Uncertainties in interfacial excess calculations from atom probe tomography data.

Atom probe tomography can be used to measure the excess of solute chemical species at internal interfaces, but common protocols do not usually consider the compositional uncertainty of the (usually dilute) solute. Here, general models are derived for the composition profile of a solute segregated to the interface between two grains or phases. This model is fit to experimental data, with the cumulative compositional uncertainty included in the calculation of the interfacial excess. It is shown that the relative uncertainty in the interfacial excess can be large for dilute solutes, even when segregation is obvious in the concentration profile. Different methods for estimating the extent of the boundary provide different estimates for the interfacial excess and its uncertainty. Some strategies are provided for the minimisation of uncertainties in typical data, though ultimately, a typical calculation will be limited by compositional uncertainty arising from the relatively few solute counts in the region-of-interest.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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