通过 DNA 折纸上的 DNA 链长度控制金二聚体距离的新型分析工具。

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Jannik Guckel, Zhe Liu, Zunhao Wang, Birka Lalkens, Markus Etzkorn, Daesung Park
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引用次数: 0

摘要

金属纳米粒子二聚体已被用于提高单量子发射器的激发率。二聚体的粒子间距(d)对信号增强有至关重要的影响。因此,要想获得最佳性能,就必须精确控制 d。然而,由于缺乏可靠的自动软件工具,对 d 的统计分析往往局限于少数二聚体。为此,我们开发了一种新型分析工具,用于自动二聚体分析。我们的方法将圆圈霍夫变换(CHT)的颗粒检测与针对不同类型颗粒进行优化的定制分类例程相结合。我们将这一工具应用于扫描电子显微镜(SEM)图像,在二聚体检测方面取得了很好的一致性,对于由多条 DNA 链组合控制的 DNA 折纸上的 3000 多个金属纳米粒子二聚体,自动分析与人工检测的一致性达到了 97% 左右。我们的研究揭示了DNA链长度(L)对d分布的影响。基于几何考虑,我们预计L与d的标准偏差(σ)之间存在很强的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel analysis tool for the distance of gold dimers controlled by the DNA strand length on the DNA origami.

Metallic nanoparticle dimers have been used to enhance the excitation rate of single-quantum emitters. The interparticle distance (d) of the dimers has a crucial influence on the signal enhancement. Therefore, precise control of d is desired for optimal performance. However, statistical analysis of d has been often restricted to a small number of dimers due to the lack of reliable automatic software tools. For this reason, we developed a novel analysis tool for automatic dimer analysis. Our approach combines particle detection by circle Hough transformation (CHT) with custom classification routines optimised for distinct types of particles. We applied our tool to scanning electron microscopy (SEM) images and achieved great agreement in dimer detection, reaching an agreement of around 97% between automatic analysis and manual inspection for more than 3000 metallic nanoparticle dimers on DNA origami controlled by a combination of multiple DNA strands. Our study revealed the effects of the strand length (L) on the distribution of d. Based on geometric consideration, we expected a strong correlation between L and the standard deviation (σ) of d. We could verify this correlation by characterising four dimer designs with different L while analysing more than 1000 dimers per specimen.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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