基于 CRDS 测量 CO/CO2 浓度比,评估变压器绝缘老化情况

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Yuxiang Wu, Tiehua Ma, Yueting Zhou, Ting Gong, Yali Tian, Xiaocong Sun, Guqing Guo, Xuanbing Qiu, Chuanliang Li
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引用次数: 0

摘要

利用空腔环降光谱(CRDS)技术开发了一种气体分析仪,旨在同时测量二氧化碳和一氧化碳的浓度。这些气体是变压器绝缘降解的关键指标。分析仪的二氧化碳浓度范围从几 ppm 到几千 ppm,可测量的 CO/CO2 浓度比从 0.076 到 0.8。选定的 CO 和 CO2 吸收线分别以 6337.99 和 6338.59 cm-1 为中心。这两条候选线相互靠近且不重叠。实验结果表明,该系统准确地拟合了测量和计算的信号,能够测量出 ppm 级别的浓度。这证明该系统能够测量对评估变压器绝缘状况至关重要的气体浓度和比率。这种基于 CRDS 的系统为早期检测潜在的变压器故障提供了一种可靠而灵敏的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CRDS-based measurement of CO/CO2 concentration ratios for assessing transformer insulation aging

A gas analyzer has been developed using cavity ring-down spectroscopy (CRDS) technology, designed to simultaneously measure the concentrations of CO2 and CO. These gases are critical indicators of transformer insulation degradation. The analyzer covers a CO2 concentration range from a few ppm to several thousand ppm and can measure CO/CO2 concentration ratios from 0.076 to 0.8. The selected absorption lines for CO and CO2 are centered at 6337.99 and 6338.59 cm−1, respectively. The two candidate lines are proximate to each other and nonoverlapping. The experimental results indicate that the system accurately fits the measured and calculated signals, enabling concentration measurements at the ppm level. This confirms its ability to measure the gas concentrations and ratios critical for assessing the condition of transformer insulation. This CRDS-based system offers a reliable and sensitive method for early detection of potential transformer faults.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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