Object Localization in Highly Cluttered Environments Using Neural Network Learning on Microwave Scattering Data

Bifocusing-based microwave imaging is a promising direct imaging method for object localization in various applications. However, the method has the limitation that it only works well in environments with a homogenous background. In this paper, we present a direct microwave imaging method using a neural network (NN) model that can localize a small object even in highly cluttered environments with strong scatterers. The NN model is trained on some data sets obtained through multistatic measurements in a nonhomogeneous environment. To verify the approach, we prepared an experimental testbed equipped with a water tank containing 3 strong scatterers and 16 antennas to obtain 920 MHz multistatic scattering data. This experiment shows good localization performance, with an average localization error of approximately 4 mm (1/9 of a wavelength) over the entire experimental area, even in a strong scattering background.