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引用次数: 0
摘要
双晶体管-零电容(2T0C)DRAM 单元作为内存中处理(PIM)应用的存储器件已被提出并广泛研究。在这篇文章的两个部分中,我们提出了一种新颖的栅极垂直晶体管(VTG)2T0C DRAM 单元结构和用于 PIM 应用的刷新技术,并演示了它们的有效性。在第一部分中,我们介绍了 VTG DRAM 的改进保持特性;在第二部分中,我们介绍了自适应分层刷新技术,以最大限度地降低刷新能耗,同时保持推理精度。此外,我们还开发了一个定制的仿真框架,用于评估基于 2T0C DRAM 的 PIM 宏的推断精度和硬件性能。通过反映第一部分中提取的器件特性的仿真,与传统刷新方法相比,分层刷新技术可实现 92% 和 91% 的相同推断精度,刷新能耗分别降低了 22.9% 和 16%。
Advanced 2T0C DRAM Technologies for Processing-in-Memory—Part II: Adaptive Layer-Wise Refresh Technique
Two-transistor-zero-capacitor (2T0C) DRAM cell has been proposed and extensively investigated as a memory device for processing-in-memory (PIM) applications. In this two-part article, we propose a novel vertical-transistor on the gate (VTG) 2T0C DRAM cell structure and the refresh technique for PIM applications and demonstrate their effectiveness. We described the improved retention characteristics of VTG DRAM in Part I. In Part II, we introduce the adaptive layer-wise refresh technique to minimize refresh energy consumption while maintaining the inference accuracy. Additionally, we developed a customized simulation framework to evaluate the inference accuracy and hardware performance of the 2T0C DRAM-based PIM macro. Through the simulations reflecting the device characteristics extracted in Part I, the layer-wise refresh technique can achieve the same inference accuracy of 92% and 91%, with refresh energy consumption reduced by 22.9% and 16% respectively, compared to the conventional refresh method.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.