用于可靠的物理不可克隆函数(PUF)的抗老化环形振荡器

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
M. Omaña , M. Grossi , D. Rossi , C. Metra
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引用次数: 0

摘要

物理不可克隆函数(PUF)是密码系统中用于验证和密钥生成的一种前景广阔的低成本解决方案。然而,文献显示,由于偏置温度不稳定性(BTI)等老化机制,PUF 在一定寿命后可能不再能生成正确的输出,从而变得不可靠。为了缓解这一问题,我们提出了一种基于环形振荡器(RO)的新型 PUF 设计,它对 BTI 退化具有很强的鲁棒性。以下简称为 "高 BTI 抗扰度环振荡器"(HBTIRRO)。我们特别介绍了 HBTIRRO 的两种可能实现方法,每种方法都对应于 BTI 鲁棒性、功耗和面积占用之间的不同权衡。我们将两种拟议的 HBTIRRO 实现方案的有效性和成本与标准 RO 以及文献中最新的替代解决方案进行了比较。我们的研究表明,我们的一种 HBTIRRO 实现方法对 BTI 具有最高的鲁棒性,与标准 RO 和最新的替代解决方案相比,频率衰减分别减少了 57.2% 和 34.6%,但所需面积相似,功耗略有增加。我们的 HBTIRRO 的另一种实现方法在面积占用方面成本非常低,同时对 BTI 的鲁棒性可与文献中最新的替代解决方案相媲美。此外,我们的研究还表明,与上述两种替代方案相比,我们的两种 HBTIRRO 实现方案在三个经典 PUF 性能指标(即唯一性、可靠性和随机性)方面具有相似或更高的值(即更好的值),并且在流程变化导致的振荡频率统计分布方面具有最高的标准偏差。因此,我们提出的两种 HBTIRRO 方案与其他方案相比,也能更安全地实现基于 RO 的 PUF。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Aging resilient ring oscillators for reliable Physically Unclonable Functions (PUFs)
Physically Unclonable Functions (PUFs) are a promising low-cost solution for authentication and key generation in cryptosystems. However, it has been shown in the literature that, due to aging mechanisms such as Bias Temperature Instability (BTI), PUFs may no longer be able to generate correct outputs after a certain lifetime, thus becoming unreliable. In order to mitigate this problem, we present a novel ring oscillator (RO) based PUF design that is highly robust against BTI degradation. It will be hereinafter referred to as Highly BTI Resilient RO – HBTIRRO. In particular, we present two possible implementations for our HBTIRRO, each one corresponding to a different tradeoff among robustness against BTI, power consumption and area occupation. We compare the effectiveness and costs of the two proposed HBTIRRO implementations to those of a standard RO, and of the most recent alternative solution presented in the literature. We show that, one of our HBTIRRO implementation features the highest robustness against BTI, enabling a reduction in frequency degradation of 57.2 % and 34.6 % with respect to the standard RO and the recent alternate solution, respectively, while requiring a similar area and some increase in power consumption. The other implementation of our HBTIRRO features a very low cost in terms of area occupation, while featuring a robustness against BTI that is comparable to the most recent alternative solution presented in the literature. Moreover, we show that, compared to both the considered alternative solutions, our two HBTIRRO implementations present similar or higher (i.e., better) values in the three classical PUF figures of merit (namely, uniqueness, reliability and randomness), and the highest standard deviation in the statistical distribution of the oscillation frequency resulting from process variation. Therefore, our two proposed HBTIRRO offer also a more secure implementation for RO-based PUF than the compared solutions.
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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