A. Yu. Obvintsev, S. A. Serov, S. A. Khatipov, N. V. Sadovskaya
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Quantitative Analysis of the Dispersion Interaction of Liquids with the Surface of Gamma-Irradiated PTFE
The Hamaker constants are calculated for the PTFE/PTFE, PTFE/tetradecane, and PTFE/water (PTFE is polytetrafluoroethylene) systems using various dielectric models. Selection of the dielectric model significantly affects the absolute values of the Hamaker constants while it has virtually no effect on their relative changes depending on the density and dielectric increment of PTFE. The total calculated changes in the work of adhesion due to van der Waals interactions, taking into account changes in density and dielectric increment in gamma-irradiated PTFE, do not exceed 11% for all dielectric models used. It is concluded that changes in surface energy upon the irradiation of PTFE cannot be explained solely by an increase in the contribution of the van der Waals interaction due to polar radiolysis products. It is necessary to consider the electrostatic interaction of stabilized charges with the dipoles of a polar liquid.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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