固体表面的光离子反射系数

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
V. P. Afanas’ev, L. G. Lobanova, V. I. Shulga
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引用次数: 0

摘要

本文介绍了光离子从固体反射的分析理论。该理论基于解决弹性散射问题的方法(奥斯瓦尔德-卡斯帕-高克勒方法),该方法已在电子散射理论中得到成功验证。基于不变嵌入法,构建了光离子从固体反射的边界值问题解决方案。考虑了粒子与无定形和多晶样品的相互作用。得到了计算粒子积分反射系数和能量的解析公式。结果表明,只有在小角度近似的框架内才能获得分析解。获得的分析解基于路径长度分布函数,并考虑了最大残留范围。分析表明,在分析理论框架内,反射系数由两个无量纲参数决定:残留范围与传输路径长度之比以及屏蔽参数。理论分析结果与计算机模拟数据进行了比较。针对 Be、C、Cu 和 W 靶的初始能量 E0 = 1-10 keV 的质子在不同散射几何条件下的反射情况进行了数值计算。粒子积分反射系数和能量的计算结果显示,分析与计算机模拟之间的一致性令人满意。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Coefficients of Light-Ion Reflection from a Solid Surface

Coefficients of Light-Ion Reflection from a Solid Surface

An analytical theory of the reflection of light ions from solids is presented. The theory is based on the method of solving the elastic scattering problem (the Oswald–Kasper–Gauckler method), successfully tested in the theory of electron scattering. The solution of a boundary value problem for light ion reflection from solids based on the invariant imbedding method is constructed. Particle interaction with amorphous and polycrystalline samples is considered. Analytical formulas for calculating the integral reflection coefficients of particles and energy are obtained. It is shown that an analytical solution can be obtained only within the framework of a small-angle approximation. The obtained analytical solutions are based on the path length distribution function taking into account the maximum residual range. It is demonstrated that within the framework of the analytical theory the reflection coefficients are determined by two dimensionless parameters: the ratio of the residual range to the transport path length and the screening parameter. The results of theoretical consideration are compared with the data of computer simulation. Numerical calculations are performed for the case of reflection of protons with initial energy E0 = 1–10 keV from Be, C, Cu, and W targets for different scattering geometries. The results of the calculated integral reflection coefficients of particles and energy show satisfactory agreement between analytics and computer simulation.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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