在 28-nm CMOS 有线接收器中使用减少分支最大似然序列检测的自适应 56-Gb/s Duo-PAM4 检测器

{"title":"在 28-nm CMOS 有线接收器中使用减少分支最大似然序列检测的自适应 56-Gb/s Duo-PAM4 检测器","authors":"Mingche Lai, Chaolong Xu, Fangxu Lv, Jiaqing Xu, Qiang Wang, Yang Ou, Xiaoyue Hu, Cewen Liu, Zhouhao Yang","doi":"10.1109/tcsi.2024.3453411","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":null,"pages":null},"PeriodicalIF":5.2000,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Adaptive 56-Gb/s Duo-PAM4 Detector Using Reduced Branch Maximum Likelihood Sequence Detection in a 28-nm CMOS Wireline Receiver\",\"authors\":\"Mingche Lai, Chaolong Xu, Fangxu Lv, Jiaqing Xu, Qiang Wang, Yang Ou, Xiaoyue Hu, Cewen Liu, Zhouhao Yang\",\"doi\":\"10.1109/tcsi.2024.3453411\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13039,\"journal\":{\"name\":\"IEEE Transactions on Circuits and Systems I: Regular Papers\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.2000,\"publicationDate\":\"2024-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Circuits and Systems I: Regular Papers\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/tcsi.2024.3453411\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems I: Regular Papers","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/tcsi.2024.3453411","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}