用于诊断和预测电缆绝缘老化的 FMCW 反射测量法

{"title":"用于诊断和预测电缆绝缘老化的 FMCW 反射测量法","authors":"Xuan Wang, Zhonghai Wang, Jean Vreuls, Bin Zhang","doi":"10.1109/tce.2024.3442817","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13208,"journal":{"name":"IEEE Transactions on Consumer Electronics","volume":"8 1","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2024-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"FMCW Reflectometry Method for Diagnosis and Prognosis of Cable Insulation Degradation\",\"authors\":\"Xuan Wang, Zhonghai Wang, Jean Vreuls, Bin Zhang\",\"doi\":\"10.1109/tce.2024.3442817\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13208,\"journal\":{\"name\":\"IEEE Transactions on Consumer Electronics\",\"volume\":\"8 1\",\"pages\":\"\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Consumer Electronics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/tce.2024.3442817\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Consumer Electronics","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/tce.2024.3442817","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}