无需相位测量的高分辨率非相干干涉成像

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Mulin Yao, Shengjie Liu, Junwei Li, Min Li, Shengqian Wang, Kai Wei, Hao Cui
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引用次数: 0

摘要

为了实现远距离、高分辨率、无源成像,我们利用光纤耦合取代了电光侦察成像系统中分段平面成像探测器的空间耦合,并提出了一种新颖的非相干干涉成像方法,避免了成像系统的分辨率受限于硅片尺寸的问题。该方法采用相位检索算法,无需测量系统中的相位,有效避免了光纤固有的抖动问题。通过仿真验证了该方法实现目标图像重建的可行性;此外,还针对简单的四杆目标进行了室内二维离散采样成像实验,并针对双杆目标进行了室外一维特征识别实验。结果表明,分辨率超过了衍射极限,目标尺寸的重建误差小于 3.5%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-resolution incoherent interference imaging without phase measurement

Aiming for long-distance, high-resolution, passive imaging, we use fiber coupling to replace the spatial coupling of the segmented planar imaging detector for electro-optical reconnaissance imaging system and propose a novel incoherent interference imaging method, which avoids the problem that the resolution of the imaging system is limited by the size of the silicon wafer. The method uses a phase retrieval algorithm and does not need to measure the phase in the system, effectively avoiding the intrinsic jitter problem of fiber optics. The feasibility of the method in achieving target image reconstruction was verified through simulation; furthermore, an indoor two-dimensional discrete sampling imaging experiment for a simple four-rod target was conducted, and an outdoor one-dimensional feature identification experiment for a two-rod target was also performed. The results showed that the resolution exceeds the diffraction limit and the reconstruction error of target size is less than 3.5%.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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