利用偏振中子反射仪进行软物质研究的功能性二氧化硅涂层磁对比层

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Olga Dikaia, Alessandra Luchini, Tommy Nylander, Alexei Grunin, Alexei Vorobiev, Alexandr Goikhman
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引用次数: 0

摘要

本研究介绍了带有可切换磁性对比层(MCL)的硅基片,用于在固液界面进行偏振中子反射测量(PNR)实验,以研究软物质表层。在对软物质样品进行标准中子反射测量(NR)实验期间,通过在同一样品上收集不同同位素对比度的实验数据,可以获得结构和成分信息。这种方法通常被称为对比度匹配,可以通过使用不同同位素对比度的溶剂(例如不同的 H2O/D2O 比率)和/或对分子进行选择性氘化来实现。不过,有些软物质系统可能会受到这种方法的干扰,或者很难实现,尤其是在生物样本的情况下。在这些情况下,带有 MCL 的固体基底是一种有吸引力的替代方法,因为与基底的磁对比可用于部分恢复样品结构的信息。更具体地说,在本研究中,通过离子束溅射沉积法在不同尺寸的硅基底上制备了涂有二氧化硅的磁软铁层。使用 X 射线反射仪、原子力显微镜、振动样品磁力计和 PNR 对其结构进行了评估。收集到的数据表明,无论基底尺寸或封盖二氧化硅层的厚度如何,MCL 参数的质量和可重复性都很高。之前提出的铁 MCL 衬底使用的是金覆盖层。这里提出的二氧化硅封盖层可以再现用于 NR 实验的标准硅基底的典型表面,并与各种软物质样品兼容。在 PNR 实验中,使用即用型 50 × 50 × 10 毫米基底对单一溶剂对比中的脂质双分子层进行表征,证明了这一应用。总之,文章强调了使用 MCL 的 PNR 在研究软物质样品方面的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Magnetic contrast layers with functional SiO2 coatings for soft-matter studies with polarized neutron reflectometry

This study introduces silicon substrates with a switchable magnetic contrast layer (MCL) for polarized neutron reflectometry (PNR) experiments at the solid–liquid interface to study soft-matter surface layers. During standard neutron reflectometry (NR) experiments on soft-matter samples, structural and compositional information is obtained by collecting experimental data with different isotopic contrasts on the same sample. This approach is normally referred to as contrast matching, and it can be achieved by using solvents with different isotopic contrast, e.g. different H2O/D2O ratios, and/or by selective deuteration of the molecules. However, some soft-matter systems might be perturbed by this approach, or it might be difficult to implement, particularly in the case of biological samples. In these scenarios, solid substrates with an MCL are an appealing alternative, as the magnetic contrast with the substrate can be used for partial recovery of information on the sample structure. More specifically, in this study, a magnetically soft Fe layer coated with SiO2 was produced by ion-beam sputter deposition on silicon substrates of different sizes. The structure was evaluated using X-ray reflectometry, atomic force microscopy, vibrating sample magnetometry and PNR. The collected data showed the high quality and repeatability of the MCL parameters, regardless of the substrate size or the thickness of the capping SiO2 layer. Previously proposed substrates with an iron MCL used an Au capping layer. The SiO2 capping layer proposed here allows reproduction of the typical surface of a standard silicon substrate used for NR experiments and is compatible with a large variety of soft-matter samples. This application is demonstrated with ready-to-use 50 × 50 × 10 mm substrates in PNR experiments for the characterization of a lipid bilayer in a single solvent contrast. Overall, the article highlights the potential of PNR with an MCL for the investigation of soft-matter samples.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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