MM 锥形 SM-MM 光纤设备中的包层模式干扰:高灵敏度温度传感器的实验演示

IF 3.1 3区 物理与天体物理 Q2 Engineering
Optik Pub Date : 2024-07-30 DOI:10.1016/j.ijleo.2024.171977
Protik Roy, Partha Roy Chaudhuri
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引用次数: 0

摘要

在此,我们报告了高性能温度传感器的实验演示,该传感器是通过级联不同的多模光纤和涂有高热光系数指数匹配凝胶的锥形单模光纤制造的。在涂层材料的不同温度条件下记录输出功率。除了基于波长偏移的多模干涉仪传感器外,这里还采用了一种独特的方法,实现了基于强度的光纤温度传感器。我们的优化设计在 29 °C 至 64 °C 范围内的温度测量灵敏度为 8.1253 µW/C,精度为 0.9 C,响应时间为 392 ms,分辨率为 0.1 C。分析模式重叠和 Ansys Lumerical 仿真验证了实验结果,肯定了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cladding modes’ interference in MM-tapered SM-MM fiber devices: Experimental demonstration of a high-sensitivity temperature sensor

Here, we report our experimental demonstration of a high-performance temperature sensor fabricated by cascading dissimilar multimode fibers and tapered single mode fiber coated with an index-matching gel of high thermo-optic coefficient. The output power is recorded under varying temperature conditions of the coated material. Besides wavelength-shifting based multimode interferometer sensor, here a unique methodology is adopted where an intensity based fiber temperature sensor is realized. Our optimized design yields a temperature measurement sensitivity of 8.1253 µW/°C, accuracy of ± 0.9 0C, response time of 392 ms and resolution of 0.1 0C within the range of 29 °C to 64 °C. Analytical mode overlap and Ansys Lumerical simulation validate experimental results, affirming the method's effectiveness.

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来源期刊
Optik
Optik 物理-光学
CiteScore
6.90
自引率
12.90%
发文量
1471
审稿时长
46 days
期刊介绍: Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.
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