基于 UCIe 的开放式芯片生态系统的测试、调试和硅生命周期管理架构

IF 2.8 3区 计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
IEEE Micro Pub Date : 2024-08-01 DOI:10.1109/mm.2024.3435702
Sridhar Muthrasanallur, Yervant Zorian
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引用次数: 0

摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
Test, Debug and Silicon Lifecycle Management Architecture for UCIe based Open Chiplet Ecosystem
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来源期刊
IEEE Micro
IEEE Micro 工程技术-计算机:软件工程
CiteScore
7.50
自引率
0.00%
发文量
164
审稿时长
>12 weeks
期刊介绍: IEEE Micro addresses users and designers of microprocessors and microprocessor systems, including managers, engineers, consultants, educators, and students involved with computers and peripherals, components and subassemblies, communications, instrumentation and control equipment, and guidance systems. Contributions should relate to the design, performance, or application of microprocessors and microcomputers. Tutorials, review papers, and discussions are also welcome. Sample topic areas include architecture, communications, data acquisition, control, hardware and software design/implementation, algorithms (including program listings), digital signal processing, microprocessor support hardware, operating systems, computer aided design, languages, application software, and development systems.
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