基于皮秒激光诱导击穿光谱成像的钢材样品偏析高分辨率显微分析

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Shoujie Li , Zixiong Qin , Yuan Lu , Ruidong Jia , Zhenzhen Wang , Yoshihiro Deguchi , Ronger Zheng
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引用次数: 0

摘要

偏析监测在钢材的质量控制中起着至关重要的作用,而利用激光诱导击穿光谱(LIBS)进行元素微量分析可作为这一过程中的一种方法。在这项研究中,我们建立了一套激光诱导击穿光谱系统,利用波长为 355 nm、重复频率为 35 Hz 的 9 ps 脉冲激光来研究钢材偏析。我们成功地分析了钢中的铝(Al)、铜(Cu)和锰(Mn)偏析。空间分辨率为 2 μm 的 LIBS 映像分析结果与电子探针显微分析 (EPMA) 得出的结果一致,从而证实了其可靠性。此外,通过使用更高的空间分辨率(1 μm),在 100 μm2 的钢面积上仍能通过 LIBS 获得精细结果。这些研究结果证明了 ps-LIBS 分辨元素偏析的有效性,并表明其作为钢检测替代工具的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

High-resolution microanalysis of steel samples segregation based on picosecond laser-induced breakdown spectroscopy imaging

High-resolution microanalysis of steel samples segregation based on picosecond laser-induced breakdown spectroscopy imaging

Segregation monitoring plays a crucial role in the quality control of steels, and elemental microanalysis using laser-induced breakdown spectroscopy (LIBS) can be employed as an approach in this process. In this study, we established a LIBS system utilizing a 9-ps pulsed laser operating at 355 nm and 35 Hz repetition to investigate steel segregation. Successful analysis of Aluminum (Al), Copper (Cu), and Manganese (Mn) segregation in steels was achieved. The LIBS mappings with a spatial resolution of 2 μm demonstrated agreement with results obtained from Electron Probe Microanalysis (EPMA), thereby affirming their reliability. Furthermore, by employing an even higher spatial resolution of 1 μm, fine results could still be acquired through LIBS on a steel area of 100 μm2. These findings demonstrate the effectiveness of ps-LIBS for resolving elemental segregation and suggest its potential as an alternative tool for steel inspection.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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