13C(3He,p0)15N 与 13C(3He,p15)15N 和 13C(3He,d0)14N 在最高 6 MeV 能量下反应的截面数据

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION
Laurin Hess, Matej Mayer, Thomas Schwarz-Selinger
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引用次数: 0

摘要

利用硅和铬基底上的无定形碳氢化合物(a-13C:H)薄膜,测量了 x = 0...15 和反应角为 135∘和 175∘时的 13C(3He,px)15N反应截面,以及反应角为 135∘时的 13C(3He,d0)14N反应截面,能量范围为 1.5 至 6 MeV。横截面是相对于金薄层 3He 的卢瑟福散射截面确定的。135∘ 和 175∘ 的计算不确定性分别为 2% 至 7%和 3% 至 15%。所确定的横截面在不确定范围内与以前的工作相一致,并以使用厚多孔碳-13 靶件获得的光谱为基准。结果以图表形式呈现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cross-section data for the reactions 13C(3He,p0)15N to 13C(3He,p15)15N and 13C(3He,d0)14N at energies up to 6 MeV

The cross-sections of the 13C(3He,px)15N reactions for x = 0...15 and reaction angles of 135 and 175 and the 13C(3He,d0)14N reaction for a reaction angle of 135 have been measured for energies from 1.5 to 6 MeV using an amorphous hydrocarbon (a–13C:H) thin film on silicon and chromium substrates. The cross-sections were determined relative to the Rutherford scattering cross-section of 3He from a thin gold layer. The calculated uncertainties range from 2 to 7% for 135 and 3 to 15% for 175. The determined cross-sections agree within the uncertainties with previous works and were benchmarked against spectra obtained using thick porous carbon-13 targets. The results are presented in graphical and tabular form.

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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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