{"title":"双指数概率分布函数及其在一些关键航空航天安全问题中的应用:视角与简要回顾","authors":"E. Suhir","doi":"10.1016/j.microrel.2024.115439","DOIUrl":null,"url":null,"abstract":"<div><p>Some critical microelectronics and photonics aerospace-safety and reliability-physics problems could be successfully addressed using a flexible and physically meaningful double-exponential-probability-distribution-function (DEPDF). It is the author's belief that a successful outcome of an undertaking of importance cannot be achieved and assured, nor even considerably improved, if the effort is not quantified, and if, because of numerous uncertain-and-inevitable intervening influences, such a quantification is not done on a probabilistic basis. This is particularly true in various “human-in-the-loop” missions and extraordinary situations, when the reliability of the equipment/instrumentation, both its hard- and software, and the performance of the involved human(s) contribute jointly to the outcome of a mission or an off-normal situation. The acceptable never-zero probability of failure cannot be high, of course, but should not be lower than necessary either. It has to be adequate for a particular system, mission and application. Products that “never fail” are most likely more expensive than they could and should be. The general concepts are illustrated by practical examples. It is concluded that while some kind of predictive modeling should always precede any type of accelerated testing, analytical (“mathematical”) modeling, employed in this write-up, should complement, whenever possible, computer simulations: these two major modeling tools are based on different assumptions, use different calculation techniques, and if the results are in agreement, then there is a good reason to believe that the obtained information is sufficiently accurate and, hence, trustworthy. Future work should be focused on the experimental verification of the suggested DEPDF model and on new areas of its possible applications in aerospace safety tasks and problems and beyond.</p></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"159 ","pages":"Article 115439"},"PeriodicalIF":1.6000,"publicationDate":"2024-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Double-exponential-probability-distribution-function and it's applications in some critical aerospace safety problems: Perspective and brief review\",\"authors\":\"E. Suhir\",\"doi\":\"10.1016/j.microrel.2024.115439\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Some critical microelectronics and photonics aerospace-safety and reliability-physics problems could be successfully addressed using a flexible and physically meaningful double-exponential-probability-distribution-function (DEPDF). It is the author's belief that a successful outcome of an undertaking of importance cannot be achieved and assured, nor even considerably improved, if the effort is not quantified, and if, because of numerous uncertain-and-inevitable intervening influences, such a quantification is not done on a probabilistic basis. This is particularly true in various “human-in-the-loop” missions and extraordinary situations, when the reliability of the equipment/instrumentation, both its hard- and software, and the performance of the involved human(s) contribute jointly to the outcome of a mission or an off-normal situation. The acceptable never-zero probability of failure cannot be high, of course, but should not be lower than necessary either. It has to be adequate for a particular system, mission and application. Products that “never fail” are most likely more expensive than they could and should be. The general concepts are illustrated by practical examples. It is concluded that while some kind of predictive modeling should always precede any type of accelerated testing, analytical (“mathematical”) modeling, employed in this write-up, should complement, whenever possible, computer simulations: these two major modeling tools are based on different assumptions, use different calculation techniques, and if the results are in agreement, then there is a good reason to believe that the obtained information is sufficiently accurate and, hence, trustworthy. Future work should be focused on the experimental verification of the suggested DEPDF model and on new areas of its possible applications in aerospace safety tasks and problems and beyond.</p></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"159 \",\"pages\":\"Article 115439\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2024-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271424001197\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271424001197","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Double-exponential-probability-distribution-function and it's applications in some critical aerospace safety problems: Perspective and brief review
Some critical microelectronics and photonics aerospace-safety and reliability-physics problems could be successfully addressed using a flexible and physically meaningful double-exponential-probability-distribution-function (DEPDF). It is the author's belief that a successful outcome of an undertaking of importance cannot be achieved and assured, nor even considerably improved, if the effort is not quantified, and if, because of numerous uncertain-and-inevitable intervening influences, such a quantification is not done on a probabilistic basis. This is particularly true in various “human-in-the-loop” missions and extraordinary situations, when the reliability of the equipment/instrumentation, both its hard- and software, and the performance of the involved human(s) contribute jointly to the outcome of a mission or an off-normal situation. The acceptable never-zero probability of failure cannot be high, of course, but should not be lower than necessary either. It has to be adequate for a particular system, mission and application. Products that “never fail” are most likely more expensive than they could and should be. The general concepts are illustrated by practical examples. It is concluded that while some kind of predictive modeling should always precede any type of accelerated testing, analytical (“mathematical”) modeling, employed in this write-up, should complement, whenever possible, computer simulations: these two major modeling tools are based on different assumptions, use different calculation techniques, and if the results are in agreement, then there is a good reason to believe that the obtained information is sufficiently accurate and, hence, trustworthy. Future work should be focused on the experimental verification of the suggested DEPDF model and on new areas of its possible applications in aerospace safety tasks and problems and beyond.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.