不同稀土掺杂对 KNN 基透明储能陶瓷的影响

IF 2.1 3区物理与天体物理 Q3 PHYSICS, APPLIED

Journal of Advanced Dielectrics Pub Date : 2024-06-04 DOI:10.1142/s2010135x24400186

Lusheng Duan, Yanliang Wei, Tao Xu, Anqi Zhang, Yanjie Zhang, Zhijun Xu, R. Chu

引用次数: 0

摘要

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Effect of different rare earth doping of KNN-based transparent energy storage ceramics

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Journal of Advanced Dielectrics PHYSICS, APPLIED-

CiteScore

3.80

自引率

6.50%

发文量

审稿时长

18 weeks

期刊介绍： The Journal of Advanced Dielectrics is an international peer-reviewed journal for original contributions on the understanding and applications of dielectrics in modern electronic devices and systems. The journal seeks to provide an interdisciplinary forum for the rapid communication of novel research of high quality in, but not limited to, the following topics: Fundamentals of dielectrics (ab initio or first-principles calculations, density functional theory, phenomenological approaches). Polarization and related phenomena (spontaneous polarization, domain structure, polarization reversal). Dielectric relaxation (universal relaxation law, relaxor ferroelectrics, giant permittivity, flexoelectric effect). Ferroelectric materials and devices (single crystals and ceramics). Thin/thick films and devices (ferroelectric memory devices, capacitors). Piezoelectric materials and applications (lead-based piezo-ceramics and crystals, lead-free piezoelectrics). Pyroelectric materials and devices Multiferroics (single phase multiferroics, composite ferromagnetic ferroelectric materials). Electrooptic and photonic materials. Energy harvesting and storage materials (polymer, composite, super-capacitor). Phase transitions and structural characterizations. Microwave and milimeterwave dielectrics. Nanostructure, size effects and characterizations. Engineering dielectrics for high voltage applications (insulation, electrical breakdown). Modeling (microstructure evolution and microstructure-property relationships, multiscale modeling of dielectrics).