Rafael Emil Klumpp, Sajjad Akbarzadeh, João Victor de Sousa Araujo, Maurice François Gonon, Fabienne Delaunois, Isolda Costa, Marie‐Georges Olivier
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Correlating corrosion modes with the microstructure of the 2XXX series alloys: A comparative approach
In this study, the localized corrosion susceptibility of AA2050‐T84, AA2198‐T851, and AA2024‐T3 alloys was compared by immersion in three test solutions, specifically sodium chloride solution (3.5% NaCl), EXCO solution, according to ASTM G34‐18, and a solution for intergranular corrosion (IGC) test recommended by ASTM G110‐15 and via scanning vibrating electrode technique (SVET). The results showed higher susceptibility of AA2050‐T84 alloy to all types of corrosion tested compared to the other studied 2XXX series alloys. Corrosion penetration was deeper in the AA2050‐T84 due to its microstructural characteristics as a difference in the micrometric Cu‐Rich intermetallic particle distribution on the surface and related to the distribution of the T1 (Al2CuLi) phase.
期刊介绍:
Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).