研究基于硬件的深度神经网络故障注入技术和基于突变的故障定位技术

{"title":"研究基于硬件的深度神经网络故障注入技术和基于突变的故障定位技术","authors":"Yves Le Traon, Tao Xie","doi":"10.1002/stvr.1880","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":501413,"journal":{"name":"Software Testing, Verification and Reliability","volume":"24 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigating fault injection techniques in hardware‐based deep neural networks and mutation‐based fault localization\",\"authors\":\"Yves Le Traon, Tao Xie\",\"doi\":\"10.1002/stvr.1880\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":501413,\"journal\":{\"name\":\"Software Testing, Verification and Reliability\",\"volume\":\"24 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Software Testing, Verification and Reliability\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/stvr.1880\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Software Testing, Verification and Reliability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/stvr.1880","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}