固体材料的微波介电性能:实用方法的特点

V. P. Krylov, R. A. Chirkov, M. O. Zabezhaylov, A. N. Khramov
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引用次数: 0

摘要

考虑了不同(工厂和计量)实验室实际使用的材料介电性能测量方法的特点,以及上述特点对测量结果的影响。奥布宁斯克 "Technologiya "科研生产企业 A. G. Romashin 放射物理学实验室和东西伯利亚分部联邦国营单一制企业 "俄罗斯技术物理和无线电工程计量研究所 "无线电工程测量部获得了测量结果。对固体材料的微波介电常数和损耗正切测量结果进行了分析。这项调查使我们有可能获得更多有关材料介电特性测量实用标准方法特点的信息,而这些信息在以前的文献中是没有的。实验室使用波导谐振器和标准化技术进行测量。工厂实验室采用固定频率测量方法,控制柱塞的共振运动;计量实验室采用固定谐振器长度测量方法,测量共振频率。测量结果表明,符合方法要求的样品结果重现性良好。测量结果表明,对吸湿性样品、异质样品和不符合直径测量方法要求的样品,测量结果的重现性有所降低。在实际使用所考虑的方法时,所获得的结果可用于提高介电性能测量的重现性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Solid materials microwave dielectric properties: features of methods practical use
Features of methods practical use for material dielectric properties measurement in different (factory and metrological) laboratories and influence of above mentioned features on measurements results are considered. Results are obtained by Obninsk Research and Production Enterprise “Technologiya” A. G. Romashin radiophysics laboratory and by East-Siberian branch Federal State Unitary Enterprise “Russian metrological institute of technical physics and radio engineering” department of radio engineering measurements. Results of microwave permittivity and loss tangent solid materials measurements are analysed. This investigation made it possible to get additional information about features of standard methods practical use for material dielectric properties measurement, which was absent in literature earlier. In laboratories for measurements used the waveguide resonator and the standardized techniques. The factory laboratory applied a measurement method at the fixed frequency with control in a resonance movement of the plunger, and in metrological laboratory a measurement method with the fixed length of the resonator and measurement at resonant frequencies. Results of measurements showed good reproducibility of results for samples that are meeting method requirements. It was revealed reducing reproducibility of measurements of hygroscopic, heterogeneous samples and in the case of nonobservance of diameter method requirements. Obtained results can be applied for reproducibility improvement of dielectric properties measurements in practical use of considered methods.
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