观测反PT对称电路中的杨氏双缝现象

Xiumei Wang, Keyu Pan, Xizhou Shen, Xingping Zhou
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引用次数: 0

摘要

在过去几十年中,量子和经典领域都对干涉进行了广泛研究,它揭示了光的波动性,并被广泛用于高精度测量。我们提出了一种现象,即具有反 PT 对称性(APT)的苏-施里弗-希格(SSH)电路模型的时变电压所呈现的离散衍射和干涉现象。为了证明 APT 电路中的杨氏双缝现象,我们首先探索了断相电压的耦合模式理论(CMT),观察了单激励下的离散衍射和双激励下的干涉。此外,我们还设计了一个移相电路,以观察相位差和距离对离散干涉的影响。我们的工作将光学效应与凝聚态物理相结合,从理论和实验上展示了电路中的杨氏双缝现象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Observation of Young's double-slit phenomenon in anti-PT-symmetric electrical circuits
In the last few decades, interference has been extensively studied in both the quantum and classical fields, which reveals light volatility and is widely used for high-precision measurements. We have put forward the phenomenon in which the discrete diffraction and interference phenomena, presented by the time-varying voltage of a Su-Schrieffer-Heeger (SSH) circuit model with an anti-PT symmetry (APT) symmetry. To demonstrate Young's double-slit phenomenon in an APT circuit, we initially explore the coupled mode theory (CMT) of voltage in the broken phase, observe discrete diffraction under single excitation and interference under double excitations. Furthermore, we design a phase-shifting circuit to observe the effects of phase difference and distance on discrete interference. Our work combines the effects in optics with condensed matter physics, show the Young's double-slit phenomenon in electrical circuits theoretically and experimentally.
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