Simone Manti, F. Napolitano, A. Clozza, Catalina Curceanu, G. Moskal, K. Piscicchia, D. Sirghi, A. Scordo
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引用次数: 0
摘要
与仅使用硅漂移探测器进行的光谱分析相比,利用色散晶体进行 X 射线发射光谱分析(XES)可显著提高能量分辨率。这种高分辨率对于研究金属尤为重要,因为它可以深入了解金属的电子结构和化学环境。与同步辐射光源相比,在实验室中进行此类实验面临着挑战,因为 X 射线管的强度降低,因此信号率低,从而增加了采集时间。在本研究中,我们证明了在几小时内就能获取铜镍锌金属合金样品的 XES 光谱,同时还能保持良好的能量分辨率和较大的动态范围。这是利用 INFN 弗拉斯卡蒂国家实验室(LNF)开发的 VOXES 光谱仪以及可增强所研究发射线信号的本底减弱程序实现的。这项研究展示了如何提高 XES 在桌面设置实验中的效率。
Enhancing Performances of the VOXES Bragg Spectrometer for XES Investigations
Utilizing a dispersive crystal for X-ray Emission Spectroscopy (XES) significantly enhances the energy resolution when compared with spectroscopy performed with just silicon drift detectors. This high resolution is particularly valuable for studying metals, as it offers essential insights into their electronic structures and chemical environments. Conducting such experiments in the laboratory, as opposed to synchrotron light sources, presents challenges due to the reduced intensities of X-ray tubes and, consequently, low signal rates, with the effect of increasing the acquisition time. In this study, we demonstrate that XES spectra can be acquired within a few hours for a CuNiZn metallic sample alloy while still maintaining a good energy resolution and a large dynamic range. This is achieved with the VOXES spectrometer, developed at INFN National Laboratories of Frascati (LNF), along with a background reduction procedure that enhances the signal from emission lines under study. This study is a showcase for improving the efficiency of XES in tabletop setup experiments.