Youna Jang, Chang In Baek, Dong Min Kim, Dal Ahn, Seong-Ho Son
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A Sub-6 GHz Switching System for Simultaneous Use of 2-Port Network Analyzer by 4 Users
A vector network analyzer (VNA) is an expensive and essential device for measuring the scattering coefficients of RF devices in the research and development of microwave systems. However, these VNAs are limited in that they can be only used by one user. To address this limitation, this paper presents a switching system that allows multiple users to measure each device under test using a single VNA at the same time. In particular, a four-user switching system is developed in this study. It is important to calibrate the differences between each channel that inevitably arise during implementation. For calibration, we propose and implement a technique for de-embedding the uneven characteristics between these channels. Its performance is validated by measuring insertion loss, reflection loss, and isolation for the developed switching system.
期刊介绍:
International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology.
Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to. . .
-Computer-Aided Modeling
-Computer-Aided Analysis
-Computer-Aided Optimization
-Software and Manufacturing Techniques
-Computer-Aided Measurements
-Measurements Interfaced with CAD Systems
In addition, the scope of the journal includes features such as software reviews, RF/microwave/mm-wave CAD related news, including brief reviews of CAD papers published elsewhere and a "Letters to the Editor" section.