电子显微镜中 Timepix3 混合像素探测器的时间校准研究

IF 2.1 3区 工程技术 Q2 MICROSCOPY
Yves Auad, Jassem Baaboura, Jean-Denis Blazit, Marcel Tencé, Odile Stéphan, Mathieu Kociak, Luiz H.G. Tizei
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引用次数: 0

摘要

由于直接电子探测具有噪声低、点扩散函数小和量子效率高等优点,目前正在电子显微镜的许多领域掀起一场革命。更具体到这项工作,Timepix3 是一种混合像素直接电子探测器,能够输出其像素阵列中单个命中点的时间信息。它的结构形成了一种数据驱动型探测器,也称为基于事件的探测器,在这种结构中,单个撞击会触发数据尽快从芯片中读出。像素阈值的存在使检测器几乎不产生读出噪声,同时还定义了命中到达时间和信号在像素阈值上的停留时间。在这项工作中,我们进行了各种实验来校准和修正 Timepix3 的时间信息,特别是在电子显微镜方面。其中包括能量校准、时间漫步和像素延迟校正,整个像素矩阵的平均时间分辨率为 1.37±0.04ns。此外,我们还对宇宙射线轨迹进行了研究,以确定沿传感器层体积的电荷动态特性,从而根据不同的偏置电压、传感器厚度和电子束电离体积,估算出探测器的时间响应极限。我们估计电离体积造成的不确定性从 60 keV 电子的约 0.8 ns 到 300 keV 电子的 8.8 ns 不等。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Time calibration studies for the Timepix3 hybrid pixel detector in electron microscopy

Direct electron detection is currently revolutionizing many fields of electron microscopy due to its lower noise, its reduced point-spread function, and its increased quantum efficiency. More specifically to this work, Timepix3 is a hybrid-pixel direct electron detector capable of outputting temporal information of individual hits in its pixel array. Its architecture results in a data-driven detector, also called event-based, in which individual hits trigger the data off the chip for readout as fast as possible. The presence of a pixel threshold value results in an almost readout-noise-free detector while also defining the hit time of arrival and the time the signal stays over the pixel threshold. In this work, we have performed various experiments to calibrate and correct the Timepix3 temporal information, specifically in the context of electron microscopy. These include the energy calibration, and the time-walk and pixel delay corrections, reaching an average temporal resolution throughout the entire pixel matrix of 1.37±0.04ns. Additionally, we have also studied cosmic rays tracks to characterize the charge dynamics along the volume of the sensor layer, allowing us to estimate the limits of the detector’s temporal response depending on different bias voltages, sensor thickness, and the electron beam ionization volume. We have estimated the uncertainty due to the ionization volume ranging from about 0.8 ns for 60 keV electrons to 8.8 ns for 300 keV electrons.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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