用于铁材料高级表征的扫描透射电子显微镜

IF 3.3 3区物理与天体物理 Q2 PHYSICS, CONDENSED MATTER

Superlattices and Microstructures Pub Date : 2023-10-16 DOI:10.20517/microstructures.2023.39

Matthew J. Cabral, Zibin Chen, Xiaozhou Liao

{"title":"用于铁材料高级表征的扫描透射电子显微镜","authors":"Matthew J. Cabral, Zibin Chen, Xiaozhou Liao","doi":"10.20517/microstructures.2023.39","DOIUrl":null,"url":null,"abstract":"Scanning Transmission electron microscopy (STEM) technologies have undergone significant advancements in the last two decades. Advancements in aberration-correction technology, ultra-high energy resolution monochromators, and state-of-the-art detectors/cameras have established STEM as an essential tool for investigating material chemistry and structure from the micro to the atomic scale. This characterization technique has been invaluable for understanding and characterizing the origins of ferroic material properties in next-generation advanced materials. Many unique properties of engineering materials, such as ferroelectricity, piezoelectricity, and ferromagnetism, are intricately linked to their atomic-scale composition and structure. STEM enables direct observation of these structural characteristics, establishing a link with macroscopic properties. In this perspective, we provide an overview of the application of advanced STEM techniques in investigating the origin of ferroic material properties, along with discussions on potential opportunities for further utilization of STEM techniques.","PeriodicalId":22044,"journal":{"name":"Superlattices and Microstructures","volume":"28 1","pages":"0"},"PeriodicalIF":3.3000,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scanning transmission electron microscopy for advanced characterization of ferroic materials\",\"authors\":\"Matthew J. Cabral, Zibin Chen, Xiaozhou Liao\",\"doi\":\"10.20517/microstructures.2023.39\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scanning Transmission electron microscopy (STEM) technologies have undergone significant advancements in the last two decades. Advancements in aberration-correction technology, ultra-high energy resolution monochromators, and state-of-the-art detectors/cameras have established STEM as an essential tool for investigating material chemistry and structure from the micro to the atomic scale. This characterization technique has been invaluable for understanding and characterizing the origins of ferroic material properties in next-generation advanced materials. Many unique properties of engineering materials, such as ferroelectricity, piezoelectricity, and ferromagnetism, are intricately linked to their atomic-scale composition and structure. STEM enables direct observation of these structural characteristics, establishing a link with macroscopic properties. In this perspective, we provide an overview of the application of advanced STEM techniques in investigating the origin of ferroic material properties, along with discussions on potential opportunities for further utilization of STEM techniques.\",\"PeriodicalId\":22044,\"journal\":{\"name\":\"Superlattices and Microstructures\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":3.3000,\"publicationDate\":\"2023-10-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Superlattices and Microstructures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.20517/microstructures.2023.39\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Superlattices and Microstructures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.20517/microstructures.2023.39","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}

引用次数: 0

摘要

扫描透射电子显微镜(STEM)技术在过去二十年中取得了重大进展。像差校正技术、超高能量分辨率单色仪和最先进的探测器/相机的进步，使STEM成为从微观到原子尺度研究材料化学和结构的重要工具。这种表征技术对于理解和表征下一代先进材料中铁材料特性的起源具有不可估量的价值。工程材料的许多独特性质，如铁电性、压电性和铁磁性，都与它们的原子级组成和结构有着错综复杂的联系。STEM可以直接观察这些结构特征，建立与宏观特性的联系。从这个角度来看，我们概述了先进的STEM技术在研究铁材料性质起源中的应用，并讨论了进一步利用STEM技术的潜在机会。

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Scanning transmission electron microscopy for advanced characterization of ferroic materials

Scanning Transmission electron microscopy (STEM) technologies have undergone significant advancements in the last two decades. Advancements in aberration-correction technology, ultra-high energy resolution monochromators, and state-of-the-art detectors/cameras have established STEM as an essential tool for investigating material chemistry and structure from the micro to the atomic scale. This characterization technique has been invaluable for understanding and characterizing the origins of ferroic material properties in next-generation advanced materials. Many unique properties of engineering materials, such as ferroelectricity, piezoelectricity, and ferromagnetism, are intricately linked to their atomic-scale composition and structure. STEM enables direct observation of these structural characteristics, establishing a link with macroscopic properties. In this perspective, we provide an overview of the application of advanced STEM techniques in investigating the origin of ferroic material properties, along with discussions on potential opportunities for further utilization of STEM techniques.

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来源期刊

Superlattices and Microstructures 物理-物理：凝聚态物理

CiteScore

6.10

自引率

3.20%

发文量

审稿时长

2.8 months

期刊介绍： Superlattices and Microstructures has continued as Micro and Nanostructures. Micro and Nanostructures is a journal disseminating the science and technology of micro-structures and nano-structures in materials and their devices, including individual and collective use of semiconductors, metals and insulators for the exploitation of their unique properties. The journal hosts papers dealing with fundamental and applied experimental research as well as theoretical studies. Fields of interest, including emerging ones, cover: • Novel micro and nanostructures • Nanomaterials (nanowires, nanodots, 2D materials ) and devices • Synthetic heterostructures • Plasmonics • Micro and nano-defects in materials (semiconductor, metal and insulators) • Surfaces and interfaces of thin films In addition to Research Papers, the journal aims at publishing Topical Reviews providing insights into rapidly evolving or more mature fields. Written by leading researchers in their respective fields, those articles are commissioned by the Editorial Board. Formerly known as Superlattices and Microstructures, with a 2021 IF of 3.22 and 2021 CiteScore of 5.4