频域参数在基于决策树的GMAW缺陷分类中的有效性

{"title":"频域参数在基于决策树的GMAW缺陷分类中的有效性","authors":"Thomas P. Rajan, K. Sundareswaran, P.R. Venkateswaran","doi":"10.1504/ijmr.2023.132839","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":40033,"journal":{"name":"International Journal of Manufacturing Research","volume":"30 1","pages":"0"},"PeriodicalIF":0.5000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effectiveness of frequency domain parameters in decision tree-based classification of GMAW defects\",\"authors\":\"Thomas P. Rajan, K. Sundareswaran, P.R. Venkateswaran\",\"doi\":\"10.1504/ijmr.2023.132839\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":40033,\"journal\":{\"name\":\"International Journal of Manufacturing Research\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Manufacturing Research\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1504/ijmr.2023.132839\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, INDUSTRIAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Manufacturing Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1504/ijmr.2023.132839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}