E. Savchenko, E. Velichko, E. Aksenov, E. Nepomnyashchaya
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Combined method for laser selection, positioning and analysis of micron and submicron cells and particles
The concept of a combined measuring system for determination of the physical and dynamical parameters of a single micron and submicron particle is proposed in this paper. The results of an experimental testing and approbation of functional parts of the suggested system are presented.