BiVO4光阳极的光电性能:从基本电子结构到缺陷钝化(会议报告)

I. Sharp, J. Cooper
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引用次数: 0

摘要

在过去的十年中,钒酸铋(BiVO4)作为一种很有前途的光阳极材料在光电化学(PEC)水分解装置中得到了广泛的研究。然而,对于该体系中的天然缺陷或杂质缺陷,它们对PEC性能的影响以及可能的钝化方案知之甚少。在这项工作中,通过实验和理论相结合的手段,对价带和导带的轨道特性进行了详细的了解。特别是,在密度泛函理论计算的支持下,互补光学和x射线光谱已经应用于化学气相沉积,自旋涂层和溅射沉积的高质量单斜BiVO4薄膜。结果表明,2.5 eV的带隙是间接带隙,2.7 eV的直接带隙较大。通过温度相关的光致发光测量观察到亚带隙辐射复合,发现存在620 meV深阱。BiVO4薄膜在H2气氛下的退火显著降低了亚带隙光致发光,这与光阳极电流的起始电位提高了~100-200 meV,填充因子增加,与背面照明相比,正面照明消除了光电流损失有关。这些薄膜上的结果,加上薄膜的XPS和粉末的固态1H NMR分析,表明氢在BiVO4中具有重要的平行作用。我们发现它在氧空位位置的取代结合导致了相关深层缺陷的钝化。此外,间隙氢作为浅层供体,有利于提高功能性光阳极的导电性。这些结果强调了对金属氧化物中载流子捕获的详细理解和控制,为提高PEC的水裂解性能提供了重要的机会。金属氧化物通常由于成分不均匀性而表现出复杂的天然缺陷性质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optoelectronic properties of BiVO4 photoanodes: From fundamental electronic structure to defect passivation(Conference Presentation)
Over the past decade, bismuth vanadate (BiVO4) has been intensely investigated as a promising photoanode material in photoelectrochemical (PEC) water splitting devices. However, little is known about native or impurity defects in this system, their effects on PEC performance, and possible passivation schemes. In this work, a detailed understanding of both the valence band and conduction band orbital character has been achieved using a combination of experimental and theoretical means. In particular, complimentary optical and X-ray spectroscopies, supported by density functional theory calculations, have been applied to high quality monoclinic BiVO4 thin films deposited by chemical vapor deposition, spin coating, and sputtering. The results demonstrate that the 2.5 eV bandgap is indirect with a higher lying 2.7 eV direct gap. Sub-bandgap radiative recombination is observed by temperature dependent photoluminescence measurements, which reveal the presence of a 620 meV deep trap. Annealing thin films of BiVO4 in a H2 atmosphere significantly reduces the sub-bandgap photoluminescence, which is correlated with an improvement by ~100-200 meV of the onset potential for photoanodic current, an increase of the fill factor, and elimination of photocurrent losses under frontside compared to backside illumination. These results on thin films, together with XPS of the thin films and solid state 1H NMR analysis of powders, suggest important parallel roles for hydrogen in BiVO4. We find that its substitutional incorporation at oxygen vacancy sites leads to passivation of associated deep level defects. In addition, interstitial hydrogen acts as a shallow level donor and beneficially increases conductivity in functional photoanodes. These results highlight that detailed understanding and controlling of carrier trapping in metal oxides, which often exhibit complex native defect properties due to compositional non-uniformities, provide significant opportunity for increasing PEC water splitting performance.
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