{"title":"提高断路器触头系统斥力阈值电流的电磁斥力分析","authors":"Hardik T. Mehta, Shanker D. Godwal","doi":"10.1109/NUICONE.2015.7449606","DOIUrl":null,"url":null,"abstract":"This paper presents investigation on electromagnetic repulsion force of contact system for enhancement in repulsion threshold current in MCCB. Current flows on moving contact and fixed contact are repulsive in nature due to structure of contact system. Due to current concentration between electrical contacts and between two conductors, magnetic flux density produces electromagnetic repulsion force. Electromagnetic repulsion force can improve current limiting ability through enhancement in repulsion threshold current of contact system is presented. For enhancing in repulsion threshold current of contact system, we calculate electromagnetic repulsion force and finite element analysis are adapted.","PeriodicalId":131332,"journal":{"name":"2015 5th Nirma University International Conference on Engineering (NUiCONE)","volume":"344 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Analysis of electromagnetic repulsion force for enhancement in repulsion threshold current of contact system in MCCB\",\"authors\":\"Hardik T. Mehta, Shanker D. Godwal\",\"doi\":\"10.1109/NUICONE.2015.7449606\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents investigation on electromagnetic repulsion force of contact system for enhancement in repulsion threshold current in MCCB. Current flows on moving contact and fixed contact are repulsive in nature due to structure of contact system. Due to current concentration between electrical contacts and between two conductors, magnetic flux density produces electromagnetic repulsion force. Electromagnetic repulsion force can improve current limiting ability through enhancement in repulsion threshold current of contact system is presented. For enhancing in repulsion threshold current of contact system, we calculate electromagnetic repulsion force and finite element analysis are adapted.\",\"PeriodicalId\":131332,\"journal\":{\"name\":\"2015 5th Nirma University International Conference on Engineering (NUiCONE)\",\"volume\":\"344 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 5th Nirma University International Conference on Engineering (NUiCONE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUICONE.2015.7449606\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 5th Nirma University International Conference on Engineering (NUiCONE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUICONE.2015.7449606","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of electromagnetic repulsion force for enhancement in repulsion threshold current of contact system in MCCB
This paper presents investigation on electromagnetic repulsion force of contact system for enhancement in repulsion threshold current in MCCB. Current flows on moving contact and fixed contact are repulsive in nature due to structure of contact system. Due to current concentration between electrical contacts and between two conductors, magnetic flux density produces electromagnetic repulsion force. Electromagnetic repulsion force can improve current limiting ability through enhancement in repulsion threshold current of contact system is presented. For enhancing in repulsion threshold current of contact system, we calculate electromagnetic repulsion force and finite element analysis are adapted.
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