具有稳健PVT性能的60GHz BiST相控阵系统高灵敏度探测器

2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems Pub Date : 2012-03-01 DOI:10.1109/SIRF.2012.6160149

E. Cohen, A. Israel, O. Degani, D. Ritter

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引用次数: 4

摘要

介绍了一种60GHz高灵敏度大动态范围探测器相控阵芯片的内置自检系统。该系统测量阵列移相器相对步进的精度为5度，通过环回测量TX和RX链的增益，跨过程、温度和电压(PVT)的精度为+/-1dB。该系统由具有开关耦合的链之间的射频组合检测器路径、基于自混合的低噪声检测器以及补偿温度和工艺变化的偏置电路组成。PA输出上的检测器断开状态负载为0.2dB。

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High sensitivity detector with robust PVT performance for 60GHz BiST phased array systems in 90nm CMOS

A built in self test (BiST) system for a 60GHz phased array chip with high sensitivity large dynamic range detectors is presented. The system measures the array phase shifter relative step with an accuracy of 5deg and the gain of the TX and RX chain through loopback with an accuracy of +/-1dB across process, temperature, and voltage (PVT). The system is composed of an RF combining detector path between chains with switched coupling, low noise detectors based on self mixing, and bias circuits that compensate for temperature and process variation. The Detector off state load on the PA output is 0.2dB.

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2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

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