{"title":"非环境温度下的EMC测试","authors":"J. Makaran","doi":"10.1109/CCECE47787.2020.9255705","DOIUrl":null,"url":null,"abstract":"The following paper proposes a method for performing all facets of EMC Testing at temperatures other than ambient. An examination of operational requirements of electronic assemblies is presented through an examination of operating temperature requirements for electronic assemblies from different industrial sectors. This is followed by examination of the requirements of EMC specifications, followed by a proposal of the specifications required for an ideal device to perform EMC testing at temperatures other than ambient.","PeriodicalId":296506,"journal":{"name":"2020 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"EMC Testing at Temperatures Other than Ambient\",\"authors\":\"J. Makaran\",\"doi\":\"10.1109/CCECE47787.2020.9255705\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The following paper proposes a method for performing all facets of EMC Testing at temperatures other than ambient. An examination of operational requirements of electronic assemblies is presented through an examination of operating temperature requirements for electronic assemblies from different industrial sectors. This is followed by examination of the requirements of EMC specifications, followed by a proposal of the specifications required for an ideal device to perform EMC testing at temperatures other than ambient.\",\"PeriodicalId\":296506,\"journal\":{\"name\":\"2020 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)\",\"volume\":\"75 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE47787.2020.9255705\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE47787.2020.9255705","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The following paper proposes a method for performing all facets of EMC Testing at temperatures other than ambient. An examination of operational requirements of electronic assemblies is presented through an examination of operating temperature requirements for electronic assemblies from different industrial sectors. This is followed by examination of the requirements of EMC specifications, followed by a proposal of the specifications required for an ideal device to perform EMC testing at temperatures other than ambient.
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