SIS阵列混频器的转换效率和噪声测量

1981 International Conference on Submillimeter Waves and Their Applications Pub Date : 1981-12-01 DOI:10.1109/ICSWA.1981.9335104

H. van Kempen, W. R. McGrath, P. Richards, A. D. Smith, R. E. Harris, F. Lloyd

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摘要

采用铅合金SIS隧道结串联阵列[1]的准粒子外差混频器已经在36 GHz下进行了测试。这些阵列各自显示出大约5dB的转换损耗。对1、10和50结阵列分别测量了9.8±5K、34±12k和85±25k的单边带噪声温度。在10和50结阵列中观察到明显增加的饱和水平。

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Conversion Efficiency and Noise Measurements of SIS Array Mixers

Quasiparticle heterodyne mixers which use series arrays [1] of Pb-alloy SIS tunnel junctions have been tested at 36 GHz. These arrays each showed a conversion loss of approximately 5dB. Single-sideband noise temperatures of 9.8 ± 5K, 34 ± 12 K, and 85 ± 25 K were measured for 1, 10 and 50 junction arrays respectively. Significantly increased saturation levels were observed for the 10 and 50 junction arrays.

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1981 International Conference on Submillimeter Waves and Their Applications

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