S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol
{"title":"模拟基本尖端形状及其场发射","authors":"S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol","doi":"10.1109/IVNC49440.2020.9203096","DOIUrl":null,"url":null,"abstract":"The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.","PeriodicalId":292538,"journal":{"name":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling basic tip forms and its field emission\",\"authors\":\"S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol\",\"doi\":\"10.1109/IVNC49440.2020.9203096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.\",\"PeriodicalId\":292538,\"journal\":{\"name\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"201 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC49440.2020.9203096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC49440.2020.9203096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.