模拟基本尖端形状及其场发射

S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol
{"title":"模拟基本尖端形状及其场发射","authors":"S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol","doi":"10.1109/IVNC49440.2020.9203096","DOIUrl":null,"url":null,"abstract":"The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.","PeriodicalId":292538,"journal":{"name":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling basic tip forms and its field emission\",\"authors\":\"S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol\",\"doi\":\"10.1109/IVNC49440.2020.9203096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.\",\"PeriodicalId\":292538,\"journal\":{\"name\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"201 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC49440.2020.9203096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC49440.2020.9203096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

场增强因子(FEF)是场发射研究中的一个重要参数。几位作者提出了许多描述FEF的方法,每种方法都有针对特定发射极形状的建议公式。在这项工作中,我们根据文献中的主要发射极形状对FEF进行分组。在这些形状中,我们分析了发射电流,发射极上的电场分布以及其他特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling basic tip forms and its field emission
The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.
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