工件图像中圆弧的检测

{"title":"工件图像中圆弧的检测","authors":"A. Milano, F. Perotti, S. Serpico, G. Vernazza","doi":"10.1007/3-540-51815-0_65","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":179167,"journal":{"name":"Recent Issues in Pattern Analysis and Recognition","volume":"322 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Detection of arcs in workpiece images\",\"authors\":\"A. Milano, F. Perotti, S. Serpico, G. Vernazza\",\"doi\":\"10.1007/3-540-51815-0_65\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":179167,\"journal\":{\"name\":\"Recent Issues in Pattern Analysis and Recognition\",\"volume\":\"322 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Recent Issues in Pattern Analysis and Recognition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/3-540-51815-0_65\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Issues in Pattern Analysis and Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/3-540-51815-0_65","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}