{"title":"锁相环应用的正反馈CMOS电荷泵电路","authors":"E. J. Hernández, A. Diaz Sanchez","doi":"10.1109/MWSCAS.2001.986317","DOIUrl":null,"url":null,"abstract":"Two new charge-pump topologies for RF applications are presented. Their switching speed is increased by using positive feedback, while the power consumption is reduced with current reuse paths. Simulation results for a 0.35 /spl mu/m AMS CMOS technology parameters, shows the feasibility of both structures for low-voltage high-frequency applications.","PeriodicalId":403026,"journal":{"name":"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)","volume":"445 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Positive feedback CMOS charge-pump circuits for PLL applications\",\"authors\":\"E. J. Hernández, A. Diaz Sanchez\",\"doi\":\"10.1109/MWSCAS.2001.986317\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two new charge-pump topologies for RF applications are presented. Their switching speed is increased by using positive feedback, while the power consumption is reduced with current reuse paths. Simulation results for a 0.35 /spl mu/m AMS CMOS technology parameters, shows the feasibility of both structures for low-voltage high-frequency applications.\",\"PeriodicalId\":403026,\"journal\":{\"name\":\"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)\",\"volume\":\"445 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2001.986317\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 44th IEEE 2001 Midwest Symposium on Circuits and Systems. MWSCAS 2001 (Cat. No.01CH37257)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2001.986317","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Positive feedback CMOS charge-pump circuits for PLL applications
Two new charge-pump topologies for RF applications are presented. Their switching speed is increased by using positive feedback, while the power consumption is reduced with current reuse paths. Simulation results for a 0.35 /spl mu/m AMS CMOS technology parameters, shows the feasibility of both structures for low-voltage high-frequency applications.