用于微波辐射实时成像的金属-介电夹层结构研究

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI:10.1109/APEDE.2018.8542357

M. Medvedev, A. Oleynik

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引用次数: 0

摘要

文中给出了介质基底透射、反射和吸收的测量结果。研究了云母衬底和聚酰亚胺衬底。采用薄层镍铬、薄层碳和单层碳作为吸收剂。胆甾相液晶和Al-VOx结构作为热敏层。安装时使用R&S ZVA矢量网络分析仪在170-260 GHz范围内进行测量。探针结构可用于微波辐射成像装置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Research of Metal-Dielectric Sandwich Structures for Real-Time Imaging of Microwave Radiation

Results of measurements of transmission, reflection and absorption of dielectric substrates are given in article. The mica substrate and a polyimide substrate were probed. The thin layer of nichrome, a thin layer of carbon and a monolayer of carbon were used as absorbers. Cholesteric liquid crystal and Al-VOx structure were used as a thermosensitive layer. Measurements were taken on installation based on R&S ZVA Vector Network Analyzer in the range of 170-260 GHz. Probed structures can be used in devices for imaging of microwave radiation.

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2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)

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