基于软件生命周期的嵌入式软件可靠性预测

Ting Dong, Hui Shi, Yajie Zhu, Kai Li, Fengping Chai, Yan Wang
{"title":"基于软件生命周期的嵌入式软件可靠性预测","authors":"Ting Dong, Hui Shi, Yajie Zhu, Kai Li, Fengping Chai, Yan Wang","doi":"10.1109/ISKE47853.2019.9170437","DOIUrl":null,"url":null,"abstract":"In order to guarantee the quality of embedded software, based on the software life cycle, a BP neural network is proposed to predict the software reliability. First analyze the various factors that affect the reliability of the software, and then select the metrics that affect the reliability of the software based on relevant standards and engineering practices. The software reliability measurement data in the actual project was collected, and the established software reliability prediction model is used to predict the software module defects, and the prediction results are compared with the real results. The comparison results show that the model can effectively predict the number of software module defects and effectively indicate the test key module for the software unit test work.","PeriodicalId":399084,"journal":{"name":"2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Embedded Software Reliability Prediction Based on Software Life Cycle\",\"authors\":\"Ting Dong, Hui Shi, Yajie Zhu, Kai Li, Fengping Chai, Yan Wang\",\"doi\":\"10.1109/ISKE47853.2019.9170437\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to guarantee the quality of embedded software, based on the software life cycle, a BP neural network is proposed to predict the software reliability. First analyze the various factors that affect the reliability of the software, and then select the metrics that affect the reliability of the software based on relevant standards and engineering practices. The software reliability measurement data in the actual project was collected, and the established software reliability prediction model is used to predict the software module defects, and the prediction results are compared with the real results. The comparison results show that the model can effectively predict the number of software module defects and effectively indicate the test key module for the software unit test work.\",\"PeriodicalId\":399084,\"journal\":{\"name\":\"2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISKE47853.2019.9170437\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISKE47853.2019.9170437","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

为了保证嵌入式软件的质量,基于软件生命周期,提出了基于BP神经网络的软件可靠性预测方法。首先分析影响软件可靠性的各种因素,然后根据相关标准和工程实践选择影响软件可靠性的度量。收集实际项目中的软件可靠性测量数据,利用建立的软件可靠性预测模型对软件模块缺陷进行预测,并将预测结果与实际结果进行对比。对比结果表明,该模型能够有效地预测软件模块缺陷的数量,有效地指出软件单元测试工作的测试关键模块。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Embedded Software Reliability Prediction Based on Software Life Cycle
In order to guarantee the quality of embedded software, based on the software life cycle, a BP neural network is proposed to predict the software reliability. First analyze the various factors that affect the reliability of the software, and then select the metrics that affect the reliability of the software based on relevant standards and engineering practices. The software reliability measurement data in the actual project was collected, and the established software reliability prediction model is used to predict the software module defects, and the prediction results are compared with the real results. The comparison results show that the model can effectively predict the number of software module defects and effectively indicate the test key module for the software unit test work.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信