一种新型宽带、低插入损耗SiGe数字阶跃衰减器

Clifford D. Y. Cheon, Moon-Kyu Cho, Sunil G. Rao, A. Cardoso, J. Connor, J. Cressler
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引用次数: 2

摘要

本文提出了一种利用SiGe hbt实现的新型宽带数字阶跃衰减器(DSA)。SiGe HBT的垂直轮廓呈现小的寄生并联电容,因此,开关型衰减器中的开关损耗显着降低。对于以0.5 dB阶跃覆盖31.5 dB最大衰减的6位DSA,低衰减单元使用具有反向饱和SiGe HBT的减小t型单元,高衰减单元使用具有新型反并行(AP) SiGe HBT对系列开关的开关pi型单元。除了AP SiGe HBT对的对称性外,简化t型和开关pi型电池交替放置以分布寄生成分并获得更好的整体对称性。因此,在从dc到60 GHz的宽带宽范围内实现了最先进的性能,在50 GHz时插入损耗为7.5 dB,衰减范围为31.5 dB,功耗低于2.8 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A New Wideband, Low Insertion Loss SiGe Digital Step Attenuator A New Wideband, Low Insertion Loss SiGe Digital Step Attenuator
This paper presents a new, wideband digital step attenuator (DSA) implemented using SiGe HBTs. The vertical profile of the SiGe HBT presents small parasitic shunt capacitance and, thus, the loss from the switches in a switched-type attenuator is significantly reduced. For a 6-bit DSA covering a maximum attenuation of 31.5 dB with 0.5 dB steps, reduced T-type cells with reverse-saturated SiGe HBTs are used for low attenuation cells and switched pi-type cells with novel anti-parallel (AP) SiGe HBT pair series switches are used for high attenuation cells. In addition to the symmetry of the AP SiGe HBT pair, reduced T-type and switched pi-type cells are placed alternately to distribute parasitic components and to achieve better overall symmetry. As a result, state-of-the-art performance is achieved over a wide bandwidth, from DC-to-60 GHz, with an insertion loss of 7.5 dB at 50 GHz, 31.5 dB of attenuation range and less than 2.8 mW of power consumption.
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