VIM 3中“参考”一词的进一步解释研究

L. Chow, Yi-Ting Chen
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引用次数: 1

摘要

本文主要研究在计量溯源过程中不同的测量(或校准)体系,由于目标参数(或被测物)的基量与衍生量的特性不同,导致“测量标准”的表述不能清晰一致地表述。本文将参考VIM 3 (ISO / IEC指南99-2007)中的“参考”一词,并结合几个与基础量和衍生量测量相关的测量(或校准)系统的实际案例,从测量标准的角度进一步解释和分析计量溯源性和校准层次问题。详细介绍了中国台北国家测量实验室(NML)新建立的计量溯源图绘制流程,该流程包括七个步骤,首先确定预期“测量结果”的“被测物”,然后确定“参考物”,传统上“参考物”是“测量标准”、“测量系统”、被测量的“数量种类”和系统的“量值”,制定“测量模型(或方程)”。最后,每次校准中测量结果的“参考点”可追溯到更高层次的前一次校准中测量结果的“测量点”。这种计量溯源图的新表示结合了一种新的数学方法和传统的原理图方法,实现了对“计量溯源”的实际解释,以显示在NML中,不间断的校准链如何在每个测量系统上无缝和稳健地运行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Further Interpretation Study on the Term of “Reference” in VIM 3
This paper focuses the study on different measuring (or calibration) systems during the process of metrological traceability, due to the different characteristics between the base quantity and derived quantity of the target parameter (or measurand), leading to that representation of the "measurement standard” can not be clearly and consistently made statement. The author will refer to VIM 3 (ISO / IEC Guide 99-2007) for the term of “reference”, using several practical cases of measuring (or calibration) systems related to the measurand of both base quantity and derived quantity, to further interpret and analyze such issue of metrological traceability and calibration hierarchy in terms of measurement standard. In detail, this paper discloses a newly established process for drawing the metrological traceability diagram at National Measurement Laboratory (NML, Chinese Taipei) which includes seven steps, starting from identifying the “measurand” of the expected “measurement result”, then the “reference”, which traditionally would be “measurement standard”, the “measuring system”, the measured “quantity kinds” and “quantity values” of the system, the developed “measurement model (or equation)”, finally the “reference” of the measurement result in each calibration traceable to the “measurand” of the measurement result in the previous calibration of the higher hierarchy. Such new representation of the metrological traceability diagram combines a newly mathematical approach with the conventionally schematic approach to realize the practical interpretation of “metrological traceability” to show how the unbroken calibration chain is functioning seamless and robust on each measurement system in NML.
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