{"title":"利用模块化技术改进微波仪器","authors":"M. Roos","doi":"10.1109/ARFTG.1987.323860","DOIUrl":null,"url":null,"abstract":"So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using Modularity to Improve Microwave Instrumentation\",\"authors\":\"M. Roos\",\"doi\":\"10.1109/ARFTG.1987.323860\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.\",\"PeriodicalId\":287736,\"journal\":{\"name\":\"29th ARFTG Conference Digest\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1987.323860\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323860","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using Modularity to Improve Microwave Instrumentation
So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.