SEU和SEFI容错存储器系统的纠错码

S. Pontarelli, G. Cardarilli, M. Re, A. Salsano
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引用次数: 9

摘要

本文提出了对萧氏SEC-DED (Single Error Correction, Double Error Detection)码的改进。建议的代码仍然是SEC-DED代码,但它也能够纠正字节擦除。此代码已开发用于保护星载计算机的存储芯片免受SEU(单事件中断)和SEFI(单事件功能中断)故障的影响。我们所提出的码率与Hsiao码相同,特别适合于字节组织的64位存储系统。事实上,对于这些系统,可以构造一个(72,64)代码,并且可以设计一个基于9个芯片的存储器组织。字节擦除校正允许容忍在一个内存芯片中发生SEFI故障而不丢失数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Error Correction Codes for SEU and SEFI Tolerant Memory Systems
In this paper a modification of the Hsiao SEC-DED (Single Error Correction, Double Error Detection) code is presented. The proposed code is still a SEC-DED code, but it is also able to correct a byte erasure. This code has been developed to protect the memory chips of a spaceborne computer against SEU (Single Event Upset) and SEFI (Single Event Functional Interruption) faults. The code rate of our proposed code is the same of the Hsiao code and is particularly suitable for byte organized 64-bits memory systems. In fact, for these systems a (72,64) code can be constructed and a memory organization based on nine chips can be designed. The byte erasure correction allows to tolerate the occurrence of a SEFI fault in one of the memory chips without data loss.
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