一种新型相控阵天线有源阻抗测试系统

Qinggong Chang, Ziqi Jiang, Dahai Hu, Liuge Du
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引用次数: 0

摘要

当相控阵天线各单元同时馈电时,各单元之间的相互耦合会影响相控阵天线的性能。因此有源阻抗测试对PAA具有重要意义。现有的间接检测方法耗时长,劳动强度大。提出了一种在不同馈电状态下直接测试PAA有源阻抗的新方法。通过实际系统验证了该方法的有效性,并给出了实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel system for active impedance test of phased array antenna
When the units of a phased array antenna (PAA) are fed at the same time, the mutual coupling between units will impact the PAA's performance. So the active impedance test is significant to PAA. The existing indirect testing methods are time consuming and labor-intensive. A novel technique for direct PAA active impedance test under different feed states is proposed in this paper. The proposed technique is verified with a built system and the experimental results are also presented to demonstrate its performances.
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