Hg/sub - 1-x/Cd/sub -x/ Te光导探测器的温度依赖性噪声性能

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings Pub Date : 1996-12-08 DOI:10.1109/COMMAD.1996.610079

C. Musca, J.F. Siliquini, E. Smith, B. Nener, L. Faraone

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引用次数: 1

摘要

背景限制红外探测器(BLIP)的性能，在低温下获得，是光导探测器所能达到的最大性能。通过提高工作温度，可以使用热电冷却(>200 K)实现低成本探测器。研究Hg/sub - 1-x/Cd/sub -x/ Te红外探测器的温度依赖性能对于开发能够产生BLIP性能的器件结构和制造技术至关重要。本文对n型x=0.31 Hg/sub - 1-x/Cd/sub x/Te光导体在还原冷却条件下的性能进行了实验和理论研究。测量结果表明，在170 K时，D/sub /spl lambda//*的背景限制值分别为1.9/spl times/10/sup 11/ cm Hz/sup 1/2/W/sup -1/， D/sub /spl lambda//*的值分别为7.3/spl times/10/sup 10/和6.4/spl times/10/sup 9/ cm Hz/sup 1/2/W/sup -1/。

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Temperature dependent noise performance of Hg/sub 1-x/Cd/sub x/Te photoconductive detectors

Background limited infrared photodetector (BLIP) performance, attained at cryogenic temperatures, is the maximum performance achievable by a photoconductive detector. By increasing the operating temperature, low cost detectors can be realised using thermoelectric cooling (>200 K). Investigation of temperature dependent performance of Hg/sub 1-x/Cd/sub x/Te infrared detectors is essential for developing device structures and fabrication technologies capable of producing BLIP performance. In this paper the performance of n-type x=0.31 Hg/sub 1-x/Cd/sub x/Te photoconductors under reduced cooling is examined experimentally and theoretically. Measurements gave a background limited D/sub /spl lambda//* of 1.9/spl times/10/sup 11/ cm Hz/sup 1/2/W/sup -1/ up to 170 K and D/sub /spl lambda//* values of 7.3/spl times/10/sup 10/ and 6.4/spl times/10/sup 9/ cm Hz/sup 1/2/W/sup -1/ were measured at 200 K and 300 K, respectively.

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1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings

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