氦电子碰撞电离的双微分截面

Acta Physica Sinica (overseas Edition) Pub Date : 1999-03-20 DOI:10.1088/1004-423X/8/3/002

Yao Yun-fei, Chen Zhang-jin

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引用次数: 2

摘要

在BBK模型中计算了入射能量为200ev、100ev和64.6 eV时氦电子碰撞电离的双微分截面。目前的结果与Roder等人的最新测量结果和收敛紧密耦合方法的理论结果基本一致，但仍存在一些定量差异。

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Double differential cross sections for electron impact ionization of helium

The double differential cross sections for electron impact ionization of helium at incident energies of 200 eV, 100 eV and 64.6 eV have been calculated in the BBK model. The present results are found to be in generally good agreement with the latest measurements of Roder et al. and the theoretical results of the convergent close-coupling method although some quantitative discrepancy remains.

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Acta Physica Sinica (overseas Edition)

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